1～7 件を表示 ／ 全 7 件
Approach to Practical 3D Simulation
Three-dimensional process and device simulation using Crosslight's TCAD. The functions and mechanisms are introduced through various devices (CMOS image sensors, LDMOS, FINFET, DMOS, LIGBT) including mesh generation, device structure creation, and analysis. Additionally, simulation using GPUs is also introduced.
Improvement of processing speed in FDTD calculations using GPUs
The 3D lens structure and CIS 3D CMOS image sensor are picked up as benchmark examples. The GPU version of Crosslight's FDTD shows a 66-fold improvement in processing for 3D real device structures. The benchmark results achieved processing speeds equivalent to a Core i7 3930K PC with 10 clusters (equivalent to 60 cores) using an inexpensive GPU card.
Analysis tool for power semiconductor devices using Crosslight Software's TCAD.
This introduces an overview of device simulations using LDMOS with a race track-shaped polysilicon gate and DMOS with a hexagonal polysilicon gate.
Tool for comparing the presence or absence of multi-quantum barriers in LEDs.
Explaining the tunneling model of multiple quantum barriers (MQB) and superlattices (SL). Simulation comparison with and without superlattices (band diagram, L-I characteristics, internal quantum efficiency (IQE), electron leakage, etc.). Multiple quantum barriers increase the potential barrier for electrons and block electron leakage more effectively.
Research tools for high-stress GaN devices
This explains the theoretical model of GaN multi-quantum wells (MQW) under high stress. It is possible to obtain the following results for GaN device LEDs grown on silicon in arbitrary crystal orientations using the CrossLight device simulator. The tensile stress from the silicon substrate reduces the band gap of the multi-quantum wells (MQW) and results in a longer wavelength. There is a decrease in piezoelectric charges within the multi-quantum wells (MQW). The reduction in internal quantum efficiency (IQE) is caused by the increase in piezoelectric charges at the electron blocking layer (EBL) interface.
![[Data Presentation] A Must-See for Optical Design Professionals! Are you able to identify the causes of stray light?](https://image.mono.ipros.com/public/product/image/2001549268/IPROS5859286796752228133.png?w=280&h=280)
"Why is this stray light here? The unintended ghost won't disappear..." Here, we will introduce an efficient way to solve such problems.
As products become more high-performance, optical design is becoming increasingly complex and advanced. Are you struggling with performance degradation caused by "unintended light" or "stray light" that is discovered after prototyping? - Unable to identify the causes of ghosting and flaring, leading to an enormous amount of time spent on countermeasures. - Simulation results alone do not allow for a clear judgment on which part or surface is affecting the performance. - Relying on experience and intuition for countermeasures may not lead to fundamental solutions. If any of these apply to you, this document will be helpful. This document introduces the "Raypath function" of the illumination design analysis software "LightTools." It explains a groundbreaking method to identify only the problematic light paths from countless rays emitted from the light source and visualize them in 3D. By determining the root cause of "why this light reaches here?" and implementing accurate countermeasures, you can significantly reduce design revisions. We hope this will assist in improving your company's quality and accelerating development speed.
Rapid gate system design and CAE analysis with a single software.
"CAST-DESIGNER" is software equipped with both gate system design CAD functions and analysis functions. It enables the adjustment of appropriate gate systems and processing conditions in a short time. Additionally, it includes the analysis software "GEO-DESIGNER," which allows for rapid initial stage analysis, enabling design concepts that avoid defect risks at an earlier stage than gate design.
